Nano-analytical Microscope Systems
Raman - AFM - SNOM
The WITec microscopy series features scanning probe as well as high resolution optical and Raman microscopy techniques in either a single instrument or combined system configurations for the highest flexibility throughout a wide range of microscopy applications.
For example, it is possible to start with Confocal Raman Microscopy and upgrade later to Atomic Force Microscopy or vice versa. With such a combined instrument, chemical information can be directly linked to structural AFM information from the same sample area using only one instrument. For high-resolution optical information, the system can even be equipped with SNOM capabilities.
All of these methods enable nondestructive sample analysis on the nanometer scale while requiring only minimal sample preparation, if any. This extensive modularity and ease of use facilitates a more comprehensive understanding of the sample
The key technologies are:
Atomic Force Microscopy (AFM)
Scanning Nearfield Optical Microscopy (SNOM)