TMS-1200 TopMap µ.Lab with high laterat resolution

 

With its high spatial resolution, the TMS-1200 TopMap μ.Lab

measurement microscope sets new standards in non contact-

topography measurement. Simple, quick and precise, it acquires

high-resolution topographical maps of functional surfaces and

microstructures to determine critical parameters such as

flatness, ripple and roughness. Designed specifically to

characterize the micro-topography of functional surfaces and

microstructures, it is a perfect solution for products in

development or in quality control. The instrument has high

lateral resolution and can measure surfaces with different

reflectivities by using the Smart Surface Scan technique.

 

Features

 

  • Rapid, non-contact 3-D topography measurement with subnanometer resolution

  • Determination of structural topography and shape on both rough and specular surfaces

  • Smart Surface Scan technique copes with different contrast (reflectivity) levels

  • Powerful TMS software for processing data to determine topography and to characterize the surface

  • 2-D and 3-D presentation modes with video overlay

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